Publication detail

Study of solar cells defects via noise measurement

MACKŮ, R. KOKTAVÝ, P.

Original Title

Study of solar cells defects via noise measurement

English Title

Study of solar cells defects via noise measurement

Type

conference paper

Language

en

Original Abstract

This article deals with the application of noise measurements for the assessment of the quality of the solar cell itself and production technology alike. The main focus of this study is the random n-level (in most case just two-level) impulse noise, usually referred to as microplasma noise. This noise is a consequence of local breakdowns in micro-sized regions and brings about a reduction of lifetime or a destruction of the PN junction. The method is suitable for non-destructive testing of semiconductor devices. Here we pay attention to very large junctions of the solar cells.

English abstract

This article deals with the application of noise measurements for the assessment of the quality of the solar cell itself and production technology alike. The main focus of this study is the random n-level (in most case just two-level) impulse noise, usually referred to as microplasma noise. This noise is a consequence of local breakdowns in micro-sized regions and brings about a reduction of lifetime or a destruction of the PN junction. The method is suitable for non-destructive testing of semiconductor devices. Here we pay attention to very large junctions of the solar cells.

Keywords

Microplasma noise, A-type noise, Impulse duration, Impulse separation, PN junction, Solar cell

RIV year

2008

Released

05.05.2008

Publisher

Mesterprint Printinghouse Ltd.

Location

Hungary, Budapest

ISBN

978-963-06-4915-5

Book

Reliability and Life-time Prediction Conference Proceedings

Edition number

1

Pages from

96

Pages to

100

Pages count

5

BibTex


@inproceedings{BUT14905,
  author="Robert {Macků} and Pavel {Koktavý}",
  title="Study of solar cells defects via noise measurement",
  annote="This article deals with the application of noise measurements for the assessment of the quality of the solar cell itself and production technology alike. The main focus of this study is the random n-level (in most case just two-level) impulse noise, usually referred to as microplasma noise. This noise is a consequence of local breakdowns in micro-sized regions and brings about a reduction of lifetime or a destruction of the PN junction. The method is suitable for non-destructive testing of semiconductor devices. Here we pay attention to very large junctions of the solar cells.",
  address="Mesterprint Printinghouse Ltd.",
  booktitle="Reliability and Life-time Prediction Conference Proceedings",
  chapter="14905",
  howpublished="print",
  institution="Mesterprint Printinghouse Ltd.",
  year="2008",
  month="may",
  pages="96--100",
  publisher="Mesterprint Printinghouse Ltd.",
  type="conference paper"
}