Publication detail

New Reconfigurable Universal SISO Biquad Filter Implemented by Advanced CMOS Active Elements

ŠOTNER, R. LANGHAMMER, L. DOMANSKÝ, O. PETRŽELA, J. JEŘÁBEK, J. DOSTÁL, T.

Original Title

New Reconfigurable Universal SISO Biquad Filter Implemented by Advanced CMOS Active Elements

Type

conference paper

Language

English

Original Abstract

This paper presents new topology of fully universal multi-parametrically and electronically reconfigurable reconnection-less single-input single-output (SISO) voltage-mode biquad filter. The proposed structure can be reconfigured to offer each of all five second-order transfers functions (high-pass, bandpass, low-pass, band-reject and all-pass) as well as setting of pole frequency and quality factor. Special active device called controlled-gain current-controlled differential difference current conveyor of second generation has been designed in 0.35 μm CMOS technology for purposes of modeling and simulation tests of proposed filter. PSpice simulations confirm intended behavior of the topology.

Keywords

Biquads; current conveyors; electronic control; multi-parametric control; reconfiguration; universal filter

Authors

ŠOTNER, R.; LANGHAMMER, L.; DOMANSKÝ, O.; PETRŽELA, J.; JEŘÁBEK, J.; DOSTÁL, T.

Released

5. 7. 2018

Publisher

IEEE

Location

Prague, Czech Republic

ISBN

978-1-5386-5153-7

Book

Proceedings of the 2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)

Pages from

257

Pages to

260

Pages count

4

URL

https://ieeexplore.ieee.org/document/8434560

Full text in the Digital Library

http://hdl.handle.net/11012/245257

BibTex

@inproceedings{BUT148801,
  author="Roman {Šotner} and Lukáš {Langhammer} and Ondřej {Domanský} and Jiří {Petržela} and Jan {Jeřábek} and Tomáš {Dostál}",
  title="New Reconfigurable Universal SISO Biquad Filter Implemented by Advanced CMOS Active Elements",
  booktitle="Proceedings of the 2018 15th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)",
  year="2018",
  pages="257--260",
  publisher="IEEE",
  address="Prague, Czech Republic",
  doi="10.1109/SMACD.2018.8434560",
  isbn="978-1-5386-5153-7",
  url="https://ieeexplore.ieee.org/document/8434560"
}