Publication detail

A method for in-situ measurement of TID induced degradation in measurement accuracy of high-resolution ADCs

HOFMAN, J. HÁZE, J. SHARP, R.

Original Title

A method for in-situ measurement of TID induced degradation in measurement accuracy of high-resolution ADCs

English Title

A method for in-situ measurement of TID induced degradation in measurement accuracy of high-resolution ADCs

Type

lecture

Language

en

Original Abstract

This work presents a test method that allows in-situ measurements of radiation-induced changes in measurement accuracy of high resolution analog to digital converters. These converters are typically used in the data acquisition system of scientific instruments for space missions. The results of the radiation experiments on various commercial converters will be presented and discussed. The influence on the DC accuracy and integral non-linearity will be covered.

English abstract

This work presents a test method that allows in-situ measurements of radiation-induced changes in measurement accuracy of high resolution analog to digital converters. These converters are typically used in the data acquisition system of scientific instruments for space missions. The results of the radiation experiments on various commercial converters will be presented and discussed. The influence on the DC accuracy and integral non-linearity will be covered.

Keywords

AD converter, TID, radiation, dosimetry, test method

Released

30.03.2017

BibTex


@misc{BUT134650,
  author="Jiří {Hofman} and Jiří {Háze} and Richard {Sharp}",
  title="A method for in-situ measurement of TID induced degradation in measurement accuracy of high-resolution ADCs",
  annote="This work presents a test method that allows in-situ measurements of radiation-induced changes in measurement accuracy of high resolution analog to digital converters. These converters are typically used in the data acquisition system of scientific instruments for space missions. The results of the radiation experiments on various commercial converters will be presented and discussed. The influence on the DC accuracy and integral non-linearity will be covered.",
  chapter="134650",
  year="2017",
  month="march",
  type="lecture"
}