Publication detail

Nanoelectronic COupled problems solutions - nanoCOPS: modelling, multirate, model order reduction, uncertainty quantification, fast fault simulation

TER MATEN, E. PUTEK, P. GUNTHER, M. PULCH, R. TISCHENDORF, C. STROHM, C. SCHOENMAKER, W. MEURIS, P. DE SMEDT, B. BENNER, P. FENG, L. BANAGAAYA, N. YUE, Y. JANSSEN, R. J DOHMEN, J. TASIĆ, B. DELEU, F. GILLON, R. WIEERS, A. BRACHTENDORF, H. BITTNER, K. KRATOCHVÍL, T. PETRŽELA, J. ŠOTNER, R. GÖTTHANS, T. DŘÍNOVSKÝ, J. SCHÖPS, S. J DUQUE GUERRA, D. CASPER, T. DE GERSEM, H. RÖMER, U. REYNIER, P. BARROUL, P. MASLIAH, D. ROUSSEAU, B.

Original Title

Nanoelectronic COupled problems solutions - nanoCOPS: modelling, multirate, model order reduction, uncertainty quantification, fast fault simulation

Type

journal article in Web of Science

Language

English

Original Abstract

The FP7 project nanoCOPS derives new methods for simulation during development of designs of integrated products. It covers advanced simulation techniques for electromagnetics with feedback couplings to electronic circuits, heat and stress. It is inspired by interest from semiconductor industry and by a simulation tool vendor in electronic design automation. The project is on-going and the paper presents the outcomes achieved after the first half of the project duration.

Keywords

multirate; model order reduction; co-simulation; uncertainty; quantification; power-MOS devices; RF-circuitry; bond wires; coupled problems; multiphysics; fault simulation

Authors

TER MATEN, E.; PUTEK, P.; GUNTHER, M.; PULCH, R.; TISCHENDORF, C.; STROHM, C.; SCHOENMAKER, W.; MEURIS, P.; DE SMEDT, B.; BENNER, P.; FENG, L.; BANAGAAYA, N.; YUE, Y.; JANSSEN, R.; J DOHMEN, J.; TASIĆ, B.; DELEU, F.; GILLON, R.; WIEERS, A.; BRACHTENDORF, H.; BITTNER, K.; KRATOCHVÍL, T.; PETRŽELA, J.; ŠOTNER, R.; GÖTTHANS, T.; DŘÍNOVSKÝ, J.; SCHÖPS, S.; J DUQUE GUERRA, D.; CASPER, T.; DE GERSEM, H.; RÖMER, U.; REYNIER, P.; BARROUL, P.; MASLIAH, D.; ROUSSEAU, B.

Released

14. 7. 2016

ISBN

2190-5983

Periodical

Journal of Mathematics in Industry

Year of study

7

Number

2

State

Federal Republic of Germany

Pages from

1

Pages to

19

Pages count

19

URL

http://mathematicsinindustry.springeropen.com/articles/10.1186/s13362-016-0025-5

Full text in the Digital Library

http://hdl.handle.net/11012/65333

BibTex

@article{BUT126770,
  author="E Jan W {ter Maten} and Piotr {Putek} and Michael {Gunther} and Roland {Pulch} and Caren {Tischendorf} and Christian {Strohm} and Wim {Schoenmaker} and Peter {Meuris} and Bart {De Smedt} and Peter {Benner} and Lihong {Feng} and Nicodemus {Banagaaya} and Yao {Yue} and Rick {Janssen} and Jos {J Dohmen} and Bratislav {Tasić} and Frederik {Deleu} and Renaud {Gillon} and Aarnout {Wieers} and Hans-Georg {Brachtendorf} and Kai {Bittner} and Tomáš {Kratochvíl} and Jiří {Petržela} and Roman {Šotner} and Tomáš {Götthans} and Jiří {Dřínovský} and Sebastian {Schöps} and David {J Duque Guerra} and Thorben {Casper} and Herbert {De Gersem} and Ulrich {Römer} and Pascal {Reynier} and Patrice {Barroul} and Denis {Masliah} and Benoît {Rousseau}",
  title="Nanoelectronic COupled problems solutions - nanoCOPS: modelling, multirate, model order reduction, uncertainty quantification, fast fault simulation",
  journal="Journal of Mathematics in Industry",
  year="2016",
  volume="7",
  number="2",
  pages="1--19",
  doi="10.1186/s13362-016-0025-5",
  issn="2190-5983",
  url="http://mathematicsinindustry.springeropen.com/articles/10.1186/s13362-016-0025-5"
}