Publication detail

Optical Characterization of Graphene Oxide Films by Spectroscopic Ellipsometry

SCHMIEDOVÁ, V. POSPÍŠIL, J. ZMEŠKAL, O. VRETENÁR, V.

Original Title

Optical Characterization of Graphene Oxide Films by Spectroscopic Ellipsometry

Type

journal article in Scopus

Language

English

Original Abstract

The paper deals with the study of optical properties of graphene oxide (GO) by inkjet printing. Defined structure of GO can be obtained by reducing of prepared layers either by heating or by UV radiation (rGO). The dispersion function for refractive index and extinction coefficient of GO and both rGO thin films were measured by spectroscopic ellipsometry in the wavelength range of 200 – 850 nm. Spectroscopic ellipsometry (SE) was used characterize the optical response of layer of GO reduced by UV and thermal reduction GO in visible range.

Keywords

Graphene Oxide, Optical Properties, Spectroscopic Ellipsometry

Authors

SCHMIEDOVÁ, V.; POSPÍŠIL, J.; ZMEŠKAL, O.; VRETENÁR, V.

Released

1. 4. 2016

ISBN

978-3-03835-780-3

Book

Applied Chemistry in Solving of Production Goals

Edition number

851

ISBN

0255-5476

Periodical

Materials Science Forum

Number

851

State

Swiss Confederation

Pages from

199

Pages to

204

Pages count

5

URL

https://www.scientific.net/MSF.851.199

BibTex

@article{BUT123404,
  author="Veronika {Schmiedová} and Jan {Pospíšil} and Oldřich {Zmeškal} and Viliam {Vretenár}",
  title="Optical Characterization of Graphene Oxide Films by Spectroscopic Ellipsometry",
  journal="Materials Science Forum",
  year="2016",
  number="851",
  pages="199--204",
  doi="10.4028/www.scientific.net/MSF.851.199",
  issn="0255-5476",
  url="https://www.scientific.net/MSF.851.199"
}