Automated test equipment for evaluation of radiation induced changes of PMOS and RADFET transistors I-V curves including their temperature coefficients
HOFMAN, J. HÁZE, J.
A fully automated test equipment (ATE) for evaluation of radiation induced changes of PMOS transistors I-V curves and their temperature coefficients has been developed and built. The ATE is designed to provide any combination of bias conditions and temperature profile during the irradiation. Three successful research experiments have been performed and the commercial applications have been negotiated.
Automated test equipment, thermoelectric cooler, thermometers, test software, test methods, temperature effects, RADFET, TID, PMOS, temperature coefficients, MTC
168 Maxwell Avenue, Harwell, DIDCOT, Oxfordshire, OX 11 0QT, UK.