Publication detail

Feedback Control in Atomic Force Microscope used as a nano-manipulator

HROUZEK, M.

Original Title

Feedback Control in Atomic Force Microscope used as a nano-manipulator

English Title

Feedback Control in Atomic Force Microscope used as a nano-manipulator

Type

conference paper

Language

en

Original Abstract

The aims of the presented paper are to make a concise state-of-art of the most commonly used feedback loops for the atomic force micropes. Moreover, to propose a feedback control loops in order to minimize the effect of the thermal noise on the weak forces measurements and improve manipulation abilities of the AMF. Stringent demand to probe and fabricate systems of ever-shrinking sizes demands an everincreasing performance of instruments like atomic force microscopes (AFM). A typical AFM consists of a micro-cantilever with a sharp tip, a sample positioning system, a detection system and a control system. The actual commercial AFM are using standard PI controller to position the micro-cantilever tip at a desired distance from the sample. There is still a need for studies showing the optimal way of tuning these controllers in order to achieve high closed-loop performances of the positioning. Choosing other controller structures, more suitable to deal with the compromise robustness/performance can be also a solution.

English abstract

The aims of the presented paper are to make a concise state-of-art of the most commonly used feedback loops for the atomic force micropes. Moreover, to propose a feedback control loops in order to minimize the effect of the thermal noise on the weak forces measurements and improve manipulation abilities of the AMF. Stringent demand to probe and fabricate systems of ever-shrinking sizes demands an everincreasing performance of instruments like atomic force microscopes (AFM). A typical AFM consists of a micro-cantilever with a sharp tip, a sample positioning system, a detection system and a control system. The actual commercial AFM are using standard PI controller to position the micro-cantilever tip at a desired distance from the sample. There is still a need for studies showing the optimal way of tuning these controllers in order to achieve high closed-loop performances of the positioning. Choosing other controller structures, more suitable to deal with the compromise robustness/performance can be also a solution.

RIV year

2004

Released

05.09.2004

Publisher

Orgit Ltd.

Location

Glasgow, UK

ISBN

80-86059-41-3

Book

4th International Conference on Advanced Engineering Design

Pages from

182

Pages to

188

Pages count

7

Documents

BibTex


@inproceedings{BUT11550,
  author="Michal {Hrouzek}",
  title="Feedback Control in Atomic Force Microscope used as a nano-manipulator",
  annote="The aims of the presented paper are to make a concise state-of-art of the most commonly
used feedback loops for the atomic force micropes. Moreover, to propose a feedback control
loops in order to minimize the effect of the thermal noise on the weak forces measurements and
improve manipulation abilities of the AMF.
Stringent demand to probe and fabricate systems of ever-shrinking sizes demands an everincreasing
performance of instruments like atomic force microscopes (AFM). A typical AFM
consists of a micro-cantilever with a sharp tip, a sample positioning system, a detection system
and a control system. The actual commercial AFM are using standard PI controller to position
the micro-cantilever tip at a desired distance from the sample. There is still a need for studies
showing the optimal way of tuning these controllers in order to achieve high closed-loop performances
of the positioning. Choosing other controller structures, more suitable to deal with
the compromise robustness/performance can be also a solution.",
  address="Orgit Ltd.",
  booktitle="4th International Conference on Advanced Engineering Design",
  chapter="11550",
  institution="Orgit Ltd.",
  year="2004",
  month="september",
  pages="182",
  publisher="Orgit Ltd.",
  type="conference paper"
}