Ministerstvo školství, mládeže a tělovýchovy ČR - KONTAKT

- whole funder

ME 244

Czech

Grmela Lubomír, prof. Ing., CSc. - fellow researcher
Pavelka Jan, doc. Mgr., CSc. Ph.D. - fellow researcher
Šikula Josef, prof. Ing. RNDr., DrSc. - principal person responsible

Faculty of Civil Engineering
- (1989-01-01 - not assigned)

ŠIKULA, J. Chybí název. In XI.mezinárodní vědecká konference VUT - sekce Aplikovaná fyz. Brno: Fakulta stavební VUT v Brně, 1999. p. 111 ( p.)ISBN: 80-214-143.
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SADOVSKÝ, P., BARTUŠEK, K. Optimisation of the Transient Response of a Digital Filter. Radioengineering, 2000, vol. 9, no. 2, p. 14 ( p.)ISSN: 1210-2512.
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ŠIKULA, J. Chybí název. In CARTS 99. Huntsville, USA: Components Technology Institute, Inc., 1999. p. 292 ( p.)ISBN: 80-01-0195.
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ŠIKULA, J. Chybí název. In 15th Int. Conf. On Noise in Physical Systems and 1/f Fluctua. Hong Kong: The Hong Kong Polytechnic University, 1999. p. 150 ( p.)ISBN: 1-874612-2.
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GRMELA, L., TOMÁNEK, P., KOKTAVÝ, P., PAVELKA, J., ŠIKULA, J. Noise spectroscopy of thick film electroluminescent lamp. In Electronics Devices and System. Brno: Vysoké učení technické v Brně, 2001. p. 44 ( p.)ISBN: 80-214-1960-1.
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SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., ROČAK, D., BELAVIČ, D., TACANO, M. Effect of Contact Electrode on Noise and Nonlinearity of Thick-Film Resistor. In Proc. of 16th Symp. CARTS Europe 2002. Nice, France: 2002. p. 171 ( p.)ISBN: 0887-7491.
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SEDLÁKOVÁ, V., MELKES, F., ŠIKULA, J., DOBIS, P., ROČAK, D., BELAVIČ, D. Influence od Contact Electrode on Thick Film Resistors Noice and Nonlinerity. In Proc. of 38th International Conference on Microelectronics, Devices and Materials. Lipica, Slonenia: 2002. p. 245 ( p.)ISBN: 961-91023-0-4.
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SEDLÁKOVÁ, V. NDT of thick film resistors by noise spectroscopy. In Proceedings of 8th Conference STUDENT EEICT 2002. Brno: Ing. Zdeněk Novotný, CSc., 2002. p. 244 ( p.)ISBN: 80-214-2115-0.
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SEDLÁKOVÁ, V., PAVELKA, J., GRMELA, L., ŠIKULA, J., ROČAK, D., HROVAT, M., BELAVIČ, D. NOISE AND NON-LINEARITY OF THICK-FILM RESISTORS. In Proceedings of European Microelectronics packaging & interconection Symposium. Krakow, Poland: IMAPS - Poland Chapter, 2002. p. 320 ( p.)ISBN: 83-904462-8-6.
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SEDLÁKOVÁ, V. NDT of thick film resistors by noise spectroscopy. In Proceedings of 8th ECNDT. Leganes, Madrid: Spanish Society for NDT AEND, 2002. p. 215 ( p.)ISBN: 84-699-8573-6.
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SEDLÁKOVÁ, V. Noise Spectroscopy of Thick Film Resistors. In Sborník příspěvků konference Nové trendy ve fyzice. Brno: ÚFYZ FEI VUT Brno, 2001. p. 117 ( p.)ISBN: 80-214-1992-X.
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SEDLÁKOVÁ, V.; PAVELKA, J.; ŠIKULA, J.; ROČAK, D.; HROVAT, M.; BELAVIČ, D. Low Frequency Noise and Third Harmonic Testing of Thick Film Resistors as Reliability Indicators. In Proceedings of the 16th International Conference Noise in Physical Systems and 1/f Fluctuations ICNF 2001. Gainesville, Florida, USA: World Scientific, 2001. p. 747 ( p.)ISBN: 981-02-4677-3.
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ŠIKULA, J.; KOKTAVÝ, B.; PAVELKA, J.; ROČAK, D.; BELAVIČ, D.; TACANO, M. Low Frequency Noise of Thick Conducting Films. In Proc. of 15th Int. Conf. on Noise in Physical Systems and 1/f Fluctuations ICNF, Hong Kong August 1999, ed. C. Surya. Hong Kong: Bentham Press, 1999. p. 154-157. ISBN: 1-874612-28-5.
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ROČAK, D.; BELAVIČ, D.; HROVAT, M.; ŠIKULA, J.; KOKTAVÝ, P.; PAVELKA, J.; SEDLÁKOVÁ, V. Low-Frequency Noise of Thick-Film Resistors as Quality and Reliability Indicator. Microelectronics Reliability, 2002, vol. 41, no. 4, p. 531-542. ISSN: 0026-2714.
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ŠIKULA, J. Chybí název. In CARTS-EUROPE 99. East Sussex,England: ECII Ltd., 1999. p. 163 ( p.)ISBN: 80-01-0195.
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