Publications

• 2023

  ŠULC, V.; VOHÁNKA, J.; OHLÍDAL, I.; KLAPETEK, P.; OHLÍDAL, M.; KAUR, N.; VIŽĎA, F. Multi-Wavelength Angle-Resolved Scattering of Randomly Rough Surfaces Based on the Scalar Diffraction Theory. Coatings, MDPI, 2023, vol. 13, no. 11, ISSN: 2079-6412.
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  VALTR, M.; KLAPETEK, P.; MARTINEK, J.; NOVOTNY, O.; JELINEK, Z.; HORTVÍK, V.; NEČAS, D. Scanning Probe Microscopy controller with advanced sampling support. HardwareX, 2023, vol. 15, no. e00451, ISSN: 2468-0672.
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  VOHÁNKA, J.; ŠULC, V.; OHLÍDAL, I.; OHLÍDAL, M.; KLAPETEK, P. Optical method for determining the power spectral density function of randomly rough surfaces by simultaneous processing of spectroscopic reflectometry, variable-angle spectroscopic ellipsometry and angle-resolved scattering data. Optik, 2023, vol. 280, no. 170775, ISSN: 1618-1336.
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  NEČAS, D.; YACOOT, A.; VALTR, M.; KLAPETEK, P. Demystifying data evaluation in the measurement of periodic structures. Measurement Science and Technology, 2023, vol. 34, no. 5, p. 1-21. ISSN: 1361-6501.
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• 2022

  VOHÁNKA, J.; OHLÍDAL, I.; BURŠÍKOVÁ, V.; KLAPETEK, P.; KAUR, N. Optical characterization of inhomogeneous thin films with randomly rough boundaries. OPTICS EXPRESS, 2022, vol. 30, no. 2, p. 2033-2047. ISSN: 1094-4087.
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  OHLÍDAL, I.; VOHANKA, J.; BURŠÍKOVÁ, V.; DVOŘÁK, J.; KLAPETEK, P.; KAUR, N. Optical characterization of inhomogeneous thin films with randomly rough boundaries exhibiting wide intervals of spatial frequencies. OPTICS EXPRESS, 2022, vol. 30, no. 21, p. 39068-39085. ISSN: 1094-4087.
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  BURŠÍK, J.; CHARVÁTOVÁ CAMPBELL, A.; HAVLÍČEK, M.; KLAPETEK, P.; KELAROVÁ, Š.; PŘIBYL, R.; VÁCLAVÍK, R.; STUPAVSKA, M.; BURŠIKOVÁ, V. Surface morphology of nanostructured plasma-polymer thin films deposited under dusty plasma conditions. In Journal of Physics: Conference Series. Journal of Physics: Conference Series. 2022. p. 1-4. ISSN: 1742-6588.
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  Puttock, R.; Barton, C.; Saugar, E.; Klapetek, P.; Fernández-Scarioni, A.; Freitas, P.; Schumacher, H.; Ostler, T.; Chubykalo-Fesenko, O.; Kazakova, O. Local thermoelectric response from a single Neél domain wall. Science Advances, 2022, vol. 8, no. 47, p. eadc9798 ( p.)ISSN: 2375-2548.
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  Kaeseberg, T.; Grundmann, J.; Siefke, T.; Klapetek, P.; Valtr, M.; Kroker, S.; Bodermann, B. Mueller Matrix Ellipsometric Approach on the Imaging of Sub-Wavelength Nanostructures. Frontiers in Physics, 2022, vol. 9, no. 814559, ISSN: 2296-424X.
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  KLENOVSKÝ, P.; VALDHANS, J.; KREJČÍ, L.; VALTR, M.; KLAPETEK, P.; FEDOTOVA, O. Interplay between multipole expansion of exchange interaction and Coulomb correlation of exciton in colloidal II-VI quantum dots. Electronic Structure, 2022, vol. 4, no. 1, ISSN: 2516-1075.
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  FAHRBACH, M.; JIUSHAI, X.; KLAPETEK, P.; MARTINEK, J.; PEINER, E. Contact Resonance Imaging with Vertical Nanowire Arrays. In Sensoren und Messsysteme - 21. ITG/GMA Fachtagung. 1. Nuremberg: AMA Service GmbH, 2022. p. 245-250. ISBN: 9783800758364.
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  Marchi, D; Cara, E; Lupi, F. F.; Hoenicke, P.; Kayser, Y; Beckhoff, B; Castellino, M; Klapetek, P.; Zoccante, A; Laus, M; Cossi, M. Structure and stability of 7-mercapto-4-methylcoumarin self-assembled monolayers on gold: an experimental and computational analysis. Physical Chemistry Chemical Physics, 2022, vol. 24, no. 36, p. 22083-22090. ISSN: 1463-9084.
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• 2021

  NEČAS, D.; KLAPETEK, P. Synthetic Data in Quantitative Scanning Probe Microscopy. Nanomaterials, 2021, vol. 11, no. 7, p. 1-26. ISSN: 2079-4991.
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  KLAPETEK, P.; GROLICH, P.; NEZVAL, D.; VALTR, M.; ŠLESINGER, R.; NEČAS, D. GSvit - An open source FDTD solver for realistic nanoscale optics simulations. COMPUTER PHYSICS COMMUNICATIONS, 2021, vol. 265, no. 1, p. 1-11. ISSN: 1879-2944.
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  ŠUSTEK, Š.; VOHÁNKA, J.; OHLÍDAL, I.; OHLÍDAL, M.; ŠULC, V.; KLAPETEK, P.; KAUR, N. Characterization of randomly rough surfaces using angle-resolved scattering of light and atomic force microscopy. Journal of Optics, 2021, vol. 23, no. 10, p. 105602-105602. ISSN: 2040-8986.
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  Guen, E.; Chapuis, PO.; Kaur, NJ.; Klapetek, P.; Gomes, S. Impact of roughness on heat conduction involving nanocontacts. Applied Physics Letters, 2021, vol. 119, no. 16, p. 161602-1 (161602-5 p.)ISSN: 1077-3118.
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• 2020

  HU, X.; PUTTOCK, R.; KAZAKOVA, O.; ULVR, M.; KLAPETEK, P.; NEČAS, D.; NEU, V. Round robin comparison on quantitative nanometer scale magnetic field measurements by magnetic force microscopy. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2020, vol. 511, no. 1, p. 166947-1 (166947-11 p.)ISSN: 1873-4766.
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  Garnaes, J.; Necas, D.; Nielsen, L.; Madsen, MH.; Torras-Rosell, A.; Zeng, G.; Klapetek, P.; Yacoot, A. Algorithms for using silicon steps for scanning probe microscope evaluation. METROLOGIA, 2020, vol. 57, no. 6, p. 064002-1 (064002-14 p.)ISSN: 0026-1394.
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  ZEMEK, M.; BLAŽEK, P.; ŠRÁMEK, J.; ŠALPLACHTA, J.; ZIKMUND, T.; KLAPETEK, P.; TAKEDA, Y.; OMOTE, K.; KAISER, J. Voxel Size Calibration for High-resolution CT. The e-Journal of Nondestructive Testing. Wels: NDT.net, 2020. p. 1-8. ISBN: 1435-4934.
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  HEAPS, E; YACOOT, A.; DONGMO, H.; PICCO, l.; PAYTON, O.D.; RUSSEL-PAVIER, F.; KLAPETEK, P. Bringing real-time traceability to high-speed atomic force microscopy. Measurement Science and Technology, 2020, vol. 31, no. 7, p. 1-11. ISSN: 1361-6501.
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  NEČAS, D.; KLAPETEK, P.; VALTR, M. Estimation of roughness measurement bias originating from background subtraction. Measurement Science and Technology, 2020, vol. 31, no. 9, p. 094010-1 (094010-15 p.)ISSN: 0957-0233.
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  NEČAS, D.; VALTR, M.; KLAPETEK, P. How levelling and scan line corrections ruin roughness measurement and how to prevent it. Scientific Reports, 2020, vol. 10, no. 1, p. 1-15. ISSN: 2045-2322.
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  GUEN, E.; KLAPETEK, P.; PUTTOCK, R.; HAY, B.; ALLARD, A.; MAXWELL, T.; CHAPUIS, P.O.; RENAHY, D.; DAVEE, G.; VALTR, M.; MARTINEK, J.; KAZAKOVA, O.; GOMES, S. SThM-based local thermomechanical analysis: Measurement intercomparison and uncertainty analysis. INTERNATIONAL JOURNAL OF THERMAL SCIENCES, 2020, vol. 156, no. 106502, p. 1-9. ISSN: 1290-0729.
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  Marek Zemek, Pavel Blažek, Jan Šrámek, Jakub Šalplachta, Tomáš Zikmund, Petr Klapetek, Yoshihiro Takeda, Kazuhiko Omote, Jozef Kaiser. Voxel Size Calibration for High-resolution CT. Wels: 2020.
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  KLAPETEK, P.; YACOOT, A.; HORTVÍK, V.; DUCHOŇ, V.; DONGMO, H.; ŘEŘUCHA, Š.; VALTR, M.; NEČAS, D. Multiple-fibre interferometry setup for probe sample interaction measurements in atomic force microscopy. Measurement Science and Technology, 2020, vol. 31, no. 9, p. 1-11. ISSN: 0957-0233.
  Detail | WWW | Full text in the Digital Library

• 2019

  MARTINEK, J.; CHARVÁTOVÁ CAMPBELL, A.; BURŠÍKOVÁ, V.; KLAPETEK, P. Modeling the influence of roughness on nanoindentation data using finite element analysis. INTERNATIONAL JOURNAL OF MECHANICAL SCIENCES, 2019, vol. 161-162, no. 105015, p. 1-17. ISSN: 0020-7403.
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  YACOOT, A.; KLAPETEK, P.; VALTR, M.; GROLICH, P.; DONGMO, H.; LAZZERINI, M.; BRIDGES, A. Design and performance of a test rig for evaluation of nanopositioning stages. Measurement Science and Technology, 2019, vol. 30, no. 3, p. 1-10. ISSN: 1361-6501.
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  KLAPETEK, P.; CHARVÁTOVÁ CAMPBELL, A.; BURŠÍKOVÁ, V. Fast mechanical model for probe-sample elastic deformation estimation in scanning probe microscopy. Ultramicroscopy, 2019, vol. 201, no. 1, p. 18-18. ISSN: 0304-3991.
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  BLAŽEK, P.; ŠRÁMEK, J.; ZIKMUND, T.; KALASOVÁ, D.; HORTVÍK, V.; KLAPETEK, P.; KAISER, J. Voxel size and calibration for CT measurements with a small field of view. The e-Journal of Nondestructive Testing, 2019, no. 2019, p. 1-7. ISSN: 1435-4934.
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  NEČAS, D.; KLAPETEK, P.; NEU, V.; HAVLÍČEK, M.; PUTTOCK, R.; KAZAKOVA, O.; HU, X.; ZAJÍČKOVÁ, L. Determination of tip transfer function for quantitative MFM using frequency domain filtering and least squares method. Scientific Reports, 2019, no. 9, p. 1-15. ISSN: 2045-2322.
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  MARTINEK, J.; VALTR, M.; GROLICH, P.; HORTVÍK, V.; DANICK, B.; SHAKER, M.; KLAPETEK, P. Large area scanning thermal microscopy and infrared imaging system. Measurement Science and Technology, 2019, no. 30, p. 1-12. ISSN: 1361-6501.
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  ČECHALOVÁ, B.; BRÁNECKÝ, M.; KLAPETEK, P.; ČECH, V. Optical Properties of Oxidized Plasma-Polymerized Organosilicones and Their Correlation with Mechanical and Chemical Parameters. Materials, 2019, vol. 12, no. 3, p. 1-12. ISSN: 1996-1944.
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• 2018

  Guen, E.; Chapuis, PO.; Klapetek, P.; Puttock, R.; Hay, B.; Allard, A.; Maxwell, T.; Renahy, D.; Valtr, M.; Martinek, J.; Gomes, S. Local Thermophysical Properties Measurements on Polymers using Doped Silicon SThM Probe: Uncertainty Analysis and Interlaboratory Comparison. In 2018 24TH INTERNATIONAL WORKSHOP ON THERMAL INVESTIGATIONS OF ICS AND SYSTEMS (THERMINIC). 2018. p. 1-6. ISBN: 978-1-5386-6759-0.
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• 2017

  NEČAS, D.; KLAPETEK, P. Study of user influence in routine SPM data processing. Measurement Science and Technology, 2017, vol. 28, no. 3, p. 1-11. ISSN: 1361-6501.
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  CHARVÁTOVÁ CAMPBELL, A.; JELÍNEK, P.; KLAPETEK, P. Study of uncertainties of height measurements of monoatomic steps on Si 5 x 5 using DFT. Measurement Science and Technology, 2017, vol. 28, no. 3, p. 1-6. ISSN: 1361-6501.
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  FARKA, D.; COSKUN ALJABOUR, H.; BAUER, P.; ROTH, D.; BRUCKNER, B.; KLAPETEK, P.; SARICIFTCI, N.; STADLER, P. Increase in electron scattering length in PEDOT:PSS by a triflic acid post-processing. Monatshefte für Chemie, 2017, vol. 148, no. 5, p. 871-877. ISSN: 1434-4475.
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  KLENOVSKÝ, P.; ZŮDA, J.; KLAPETEK, P.; HUMLÍČEK, J. Ellipsometry of surface layers on a 1-kg sphere from natural silicon. Applied Surface Science, 2017, vol. 421, no. 1, p. 542-546. ISSN: 0169-4332.
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  KLAPETEK, P.; MARTINEK, J.; GROLICH, P.; VALTR, M.; KAUR, N. Graphics cards based topography artefacts simulations in Scanning Thermal Microscopy. International journal of heat and mass transfer, 2017, vol. 108, no. 1, p. 841-850. ISSN: 0017-9310.
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  KLAPETEK, P.; YACOOT, A.; GROLICH, P.; VALTR, M.; NEČAS, D. Gwyscan: a library to support non-equidistant scanning probe microscope measurements. Measurement Science and Technology, 2017, vol. 28, no. 3, p. 1-11. ISSN: 0957-0233.
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• 2015

  KLAPETEK, P.; VALTR, M.; MARTINEK, J. Large area high-speed metrology SPM system Large area high-speed metrology SPM system Large area high-speed metrology SPM system. NANOTECHNOLOGY, 2015, vol. 26, no. 6, p. 1-10. ISSN: 0957-4484.
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  MARTINEK, J.; KLAPETEK, P. Modeling C-AFM measurement using FEM. In Nanocon 2015. 2015. p. 1-6. ISBN: 978-80-87294-55-0.
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  MARTINEK, J.; KLAPETEK, P.; CHARVÁTOVÁ CAMPBELL, A. Methods for topography artifacts compensation in scanning thermal microscopy. Ultramicroscopy, 2015, vol. 155, no. 1, p. 55-61. ISSN: 0304-3991.
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  MARTINEK, J.; KLAPETEK, P.; HORÁKOVÁ, M.; MIRANDA, A. Numerical correction of topography artifacts in scanning thermal microscopy. In CONFERENCE PROCEEDINGS NANOCON 2015. 2015. p. 1-6. ISBN: 978-80-87294-63- 5.
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• 2014

  MARTINEK, J.; KLAPETEK, P.; CIMRMAN, R.; VALTR, M. Thermal conductivity analysis of delaminated thin films by scanning thermal microscopy. Measurement Science and Technology, 2014, vol. 25, no. 4, p. 1-12. ISSN: 0957-0233.
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  NEČAS, D.; ČUDEK, V.; VODÁK, J.; OHLÍDAL, M.; KLAPETEK, P.; ZAJÍČKOVÁ, L. Mapping of properties of thin plasma jet films using imaging spectroscopic reflectometry. Measurement Science and Technology, 2014, vol. 25, no. 11, p. 1-9. ISSN: 0957-0233.
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  MARTINEK, J.; ŠLESINGER, R.; KLAPETEK, P. Modeling C- AFM measurement using FEM. In Nanocon 2014. 2014. p. 1-6. ISBN: 978-80-87294-55- 0.
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  KLAPETEK, P.; NEČAS, D. Independent analysis of mechanical data from atomic force microscopy. Measurement Science and Technology, 2014, vol. 25, no. 4, p. 1-8. ISSN: 0957-0233.
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  LAZAR, J.; KLAPETEK, P.; VALTR, M.; HRABINA, J.; BUCHTA, Z.; ČÍP, O.; ČÍŽEK, M.; OULEHLA, J.; ŠERÝ, M. Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy. SENSORS, 2014, vol. 14, no. 1, p. 877-886. ISSN: 1424-8220.
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• 2013

  NEČAS, D.; KLAPETEK, P. One-dimensional autocorrelation and power spectrum density functions of irregularregions. Ultramicroscopy, 2013, vol. 124, no. 1, p. 13-19. ISSN: 0304-3991.
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• 2012

  NEČAS, D.; KLAPETEK, P. Gwyddion: an open-source software for SPM data analysis. CENTRAL EUROPEAN JOURNAL OF PHYSICS, 2012, vol. 10, no. 1, p. 181-188. ISSN: 1644-3608.
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• 2011

  KLAPETEK, P.; VALTR, M.; NEČAS, D.; SALYK, O.; DZIK, P. Atomic force microscopy analysis of nanoparticles in non-ideal conditions. Nanoscale Research Letters, 2011, vol. 6, no. 1, p. 1-9. ISSN: 1931-7573.
  Detail | WWW | Full text in the Digital Library

• 2010

  KLAPETEK, P.; VALTR, M.; PORUBA, A.; NEČAS, D.; OHLÍDAL, M. Rough surface scattering simulations using graphics cards. Applied Surface Science, 2010, vol. 2010, no. 256, p. 5640-5643. ISSN: 0169- 4332.
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• 2009

  OHLÍDAL, M.; OHLÍDAL, I.; KLAPETEK, P.; NEČAS, D. PRECISE MEASUREMENT OF THICKNESS DISTRIBUTION OF NON- UNIFORM THIN FILMS BY IMAGING SPECTROSCOPIC REFLECTOMETRY. In Proceedings of IMEKO 2009. Lisabon: IMEKO, 2009. p. 100-105. ISBN: 978-963-88410-0- 1.
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  MAN, J.; KLAPETEK, P.; MAN, O.; WEIDNER, A.; OBRTLÍK, K.; POLÁK, J. Extrusions and intrusions in fatigued metals: Part 2. AFM and EBSD study of the early growth of extrusions and intrusions in 316L steel fatigued at room temperature. PHILOSOPHICAL MAGAZINE, 2009, vol. 89, no. 16, p. 1337-1372. ISSN: 1478- 6435.
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• 2007

  KLAPETEK, P.; BURŠÍK, J.; MARTINEK, J. Near- field scanning optical microscope probe analysis. Ultramicroscopy, 2007, vol. 2007, no. 1, p. 1 (1 s.). ISSN: 0304- 3991.
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• 2006

  Richard Ficek, Radimír Vrba, Zuzana Kučerová, Lenka Zajíčková, Marek Eliáš, František Matějka, Jiřina Matějková, Ondřej Jašek, Petr Klapetek. Carbon nanotubes synthesized by plasma enhanced CVD: Preparation for measurements of their electrical properties. Czechoslovak Journal of Physics, 2006, no. 53, p. 1 ( p.)ISSN: 0011- 4626.
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• 2005

  OHLÍDAL, I., FRANTA, D., ČUDEK, V., BURŠÍKOVÁ, V., KLAPETEK, P., JÁKL, M. Optical measurement of mechanical stresses in diamond-like carbon films. In PROCEEDINGS OF THE SOCIETY OF PHOTO-OPTICAL INSTRUMENTATION ENGINEERS (SPIE). Proceedings of SPIE. Bellingham, Washington: Society of Photo-Optical Instrumentation Engineers (SPIE), 2005. p. 717-728. ISBN: 0-8194-5757-4. ISSN: 0277-786X.
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• 2004

  FRANTA, D., OHLÍDAL, I., KLAPETEK, P.,OHLÍDAL, M. Characterization of thin oxide films on GaAs substrates by optical methods and atomic force microscopy. Surface and Interface Analysis, 2004, vol. 36, no. 8, p. 1203-1206. ISSN: 0142- 2421.
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• 2003

  OHLÍDAL, M., OHLÍDAL, I., KLAPETEK, P., JÁKL, M., ČUDEK, V., ELIÁŠ, M. New Method for the Complete Optical Analysis of Thin Films Nonuniform in Optical Parameters. Japanese Journal of Applied Physics, 2003, vol. 2003, no. 7B, p. 4760 ( p.)ISSN: 0021- 4922.
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• 1998

  OHLÍDAL, I., FRANTA, D., OHLÍDAL, M., VIČAR, M., KLAPETEK, P. Comparison of AFM and optical methods at measuring nanometric surface roughness. In PTB - Bericht F- 34. Braunschweig, Germany: Physikalisch- Technische Bunesanstalt Ferrtiungsmestechnik, 1998. p. 123 ( p.)ISBN: 3-89701-280- 4.
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