Publications

• 2020

  Mohelský, I.; Dubroka, A.; Wyzula, J.; Slobodeniuk, A.; Martinez, G.; Krupko, Y.; Piot, B. A.; Caha, O.; Humlíček, J.; Bauer, G.; Springholz, G.; Orlita, M. Landau level spectroscopy of Bi2Te3. Physical Review B, 2020, vol. 102, no. 8, p. 085201-1 (085201-11 p.)ISSN: 1095-3795.
  Detail | WWW

• 2018

  KRUMPOLEC, R.; HOMOLA, T.; CAMERON, D.; HUMLÍČEK, J.; CAHA, O.; KULDOVÁ, K.; ZAZPE MENDIOROZ, R.; PŘIKRYL, J.; MACÁK, J. Structural and Optical Properties of Luminescent Copper(I) Chloride Thin Films Deposited by Sequentially Pulsed Chemical Vapour Deposition. Coatings, MDPI, 2018, vol. 8, no. 10, p. 1-16. ISSN: 2079-6412.
  Detail | WWW | Full text in the Digital Library

• 2017

  KLENOVSKÝ, P.; ZŮDA, J.; KLAPETEK, P.; HUMLÍČEK, J. Ellipsometry of surface layers on a 1-kg sphere from natural silicon. Applied Surface Science, 2017, vol. 421, no. 1, p. 542-546. ISSN: 0169-4332.
  Detail

• 2016

  KLENOVSKÝ, P.; KŘÁPEK, V.; HUMLÍČEK, J. Type-II InAs/GaAsSb/ GaAs Quantum Dots as Artificial Quantum Dot Molecules. ACTA PHYSICA POLONICA A, 2016, vol. 129, no. 1A, p. A62 (A65 p.)ISSN: 0587-4246.
  Detail

• 2015

  KLENOVSKÝ, P.; HEMZAL, D.; STEINDL, P.; ZIKOVÁ, M.; KŘÁPEK, V.; HUMLÍČEK, J. Polarization anisotropy of the emission from type-II quantum dots. PHYSICAL REVIEW B, 2015, vol. 92, no. 24, p. 241302-1 (241302-5 p.)ISSN: 0163-1829.
  Detail | WWW | Full text in the Digital Library

• 2009

  ŠIKOLA, T.; KEKATPURE, R.; BARNARD, E.; WHITE, J.; VAN DORPE, P.; BŘÍNEK, L.; TOMANEC, O.; ZLÁMAL, J.; LEI, D.; SONNEFRAUD, Y.; MAIER, S.; HUMLÍČEK, J.; BRONGERSMA, M. Mid-IR plasmonic antennas on silicon-rich oxinitride absorbing substrates: Nonlinear scaling of resonance wavelengths with antenna length. Applied Physics Letters, 2009, vol. 95, no. 25, p. 253109- 1 (253109-3 p.)ISSN: 0003-6951.
  Detail

• 2005

  BONAVENTUROVÁ - ZRZAVECKÁ, O.; BRANDEJSOVÁ, E.; ČECHAL, J.; POTOČEK, M.; NEBOJSA, A.; NAVRÁTIL, K.; ŠIKOLA, T.; HUMLÍČEK, J. UV in-situ degradation of PMPSi analysed by spectroscopic ellipsometry, XPS and TDS. 1. Vienna: 2005. p. 294-294.
  Detail

• 2004

  BRANDEJSOVÁ, E.; ČECHAL, J.; BONAVENTUROVÁ, O.; NEBOJSA, A.; TICHOPÁDEK, P.; URBÁNEK, M.; NAVRÁTIL, K.; ŠIKOLA, T.; HUMLÍČEK, J. In situ analysis of PMPSi thin films by spectroscopic ellipsometry. Jemná mechanika a optika, 2004, vol. 9, no. 9, p. 260 ( p.)ISSN: 0447- 6441.
  Detail

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