- Pravděpodobně máte vypnutý JavaScript. Některé funkce portálu nebudou funkční.
doc. RNDr. Pavel Hruška, CSc.
| hruskap@feec.vutbr.cz | |
| Osobní číslo VUT | 285 |
| Odeslat VUT zprávu | |
*) Citace publikací se generují jednou za 24 hodin.
| 2012 | |
|---|---|
| HRUŠKA, P.; ŠKARVADA, P. New ways in demonstrations of optical phenomena in lecturing physical optics (FYO). In New trends in physics 2012. Brno: Litera Brno, 2012. Detail | |
| GRMELA, L.; HRUŠKA, P. Simulation of electrostatic field near the surface of very thin tungsten microcathode. In Mathematical Methods in Electromagnetic Theory. Kharkiv, Ukraine: 2012. Detail | |
| GRMELA, L.; HRUŠKA, P. Simulation of quantum dot in electrostatic fields. In Mathematical Methods in Electromagnetic Theory. Kharkiv, Ukraine: 2012. Detail | |
| 2011 | |
| HRUŠKA, P.; GRMELA, L. Simulování chování kvantové tečky v elektrostatickém poli. Jemná mechanika a optika, 2011, roč. 56, č. 7- 8, Detail | |
| 2010 | |
| HRUŠKA, P.; GRMELA, L. Silicon- silicon dioxide nanostructure in electrostatic field. Acta Electrotechnica et Informatica, 2010, roč. 10, č. 3, Detail | |
| 2009 | |
| HRUŠKA, P.; GRMELA, L. EMISSION OF QD IN ELECTROSTATIC FIELDS. In International Conference Technical Computing Prague 2009T - The MathWorks, Inc. & HUMUSOFT s.r.o. & Ústav počítačové a řídicí techniky VŠCHT v Praze. Praha: The MathWorks, Inc. & HUMUSOFT s.r.o. & Ústav počítačové a řídicí techniky VŠCHT v Praze, 2009. Detail | |
| HRUŠKA, P.; GRMELA, L. Behaviour of silicon nanostructure in electric field. In Proceedings of Physics of Materials 09, V. Lisý, D. Olčák (Eds). Košice, SK: Faculty of Electrical Engineering and Informatics, Technical University of Košice, 2009. Detail | |
| 2008 | |
| HRUŠKA, P.; GRMELA, L. Electrostatic field of microcathodes formed by etching. In 6th workshop NDT 2008. Brno: Akademické nakladatelství CERM,s.r.o., 2008. Detail | |
| HRUŠKA, P.; GRMELA, L. normE field in electrospinning setup. In 6th Workshop NDT 2008. Brno: CERM, 2008. Detail | |
| 2007 | |
| HRUŠKA, P.; GRMELA, L.; KOKTAVÝ, P. Fine structure of electron traps. In New Trends in Physics. Brno: Z. Novotný, 2007. Detail | |
| HRUŠKA, P.; GRMELA, L. The LambertW function and semiconductor diode I- U curve. In EDS 07 IMAPS CS International Conference Proceedings. Brno: Ing. Zdeněk Novotný, CSc. Brno, Ondráčkova 105, 2007. Detail | |
| 2006 | |
| HRUŠKA, P. Fyzikální Optika. Brno: 2006. Detail | |
| HRUŠKA, P.; GRMELA, L.; CHOBOLA, Z. Diagnostika slunečních článků s podporou MATLABu. In Nové trendy v mikroelektronických systémech a nanotechnologiích. Brno: ing. Zdeněk Novotný, CSc., Ondráčkova 105 Brno, 2006. Detail | |
| HRUŠKA, P.; CHOBOLA, Z. Diagnostics of silicon solar cell of type G3 with bifacial alkali texture. In Proc. of the Workshop NDT 2006. Brno: Brno University of Technology, 2006. Detail | |
| HRUŠKA, P.; CHOBOLA, Z. Diagnostics of silicon solar cell of type G5 with bifacial acidic texture. In Proc. of the Workshop NDT 2006. Brno: Brno University of Technology, 2006. Detail | |
| HRUŠKA, P.; CHOBOLA, Z.; GRMELA, L. Diode I- U curve fitting with Lambert W function. In Proc. 25th Internationa Conference on Microelectronics. Niš: Serbia nad Montenegro IEEE Section, 2006. Detail | |
| 2005 | |
| HRUŠKA, P.; GRMELA, L.; KOKTAVÝ, P. Teaching Physics with Matlab. In 4th International Conference on Physics Teaching in Engineering Education PTEE 2006. Brno: European Physical Society, 2005. Detail | |
| HRUŠKA, P.; GRMELA, L.; KOKTAVÝ, P. MAPLE in General Physics E- learning. In New Trends in Physics. Brno: Ing.Zdeněk Novotný,CSc., 2005. Detail | |
| HRUŠKA, P.; GRMELA, L.; KOKTAVÝ, P. Teaching Physics with Matlab. European physical society, 2005. Detail | |
| HRUŠKA, P.; CHOBOLA, Z. Determination of the Solar Cells Series Resistance and Cftool of Matlab. In Workshop NDT 2005. Brno: Brno University of Technology, 2005. Detail | |
| HRUŠKA, P.; CHOBOLA, Z. Saturation Current Components in Solar Cell Diagnostics. In Workshop NDT 2005. Brno: Brno University of Technology, 2005. Detail | |
| HRUŠKA, P.; CHOBOLA, Z. Low current region of solar cell I- U curves. In Proc. of the Workshop NDT 2005. Brno: Brno University of Technology, 2005. Detail | |
| HRUŠKA, P.; CHOBOLA, Z. Determination of the solar cells series resistance and CFTOOL of Matlab. In Proceedings of Workshop NDT 2005. Brno: CERM, sro, 2005. Detail | |
| HRUŠKA, P.; CHOBOLA, Z. Saturation current components in solar cell diagnostics. In Proceedings of Workshop NDT 2005. Brno: CERM, sro, 2005. Detail | |
| HRUŠKA, P.; CHOBOLA, Z. Low current region of solar cell i- u curves. In Workshop NDT 2005. Brno: Akademické nakladatelství CERM, 2005. Detail | |
| HRUŠKA, P. Examples of Physics Quantities visualization. In Technical Computing Prague 2005. Praha: Humusoft CZ, 2005. Detail | |
| HRUŠKA, P.; CHOBOLA, Z.; GRMELA, L. CF toolbox in solar cell diagnostics. In Technical Computing Prague 2005. Praha: 2005. Detail | |
| 2004 | |
| HRUŠKA, P., CHOBOLA, Z. Solar Cell Diagnostics Based on the Transport Characteristics - Linear Region Below 50 mV. In Proceedings of the Conference Workshop NDT 2004. Brno: 2004. Detail | |
| HRUŠKA, P., CHOBOLA, Z. Solar Cell Diagnostics Based on the Transport Characteristics - Series Resistance. In Proceedings of the Conference Workshop NDT 2004. Brno: Faculty of Civil Engineering Brno Technology University, 2004. Detail | |
| HRUŠKA, P., GRMELA, L., KOKTAVÝ, P. MAPLE in General Physics e- Grading. In New Trends in Physics. Brno: Ing. Zdeněk Novotný, CSc., 2004. Detail | |
| 2003 | |
| KOKTAVÝ, P., HRUŠKA, P., GRMELA, L. Optika a moderní fyzika. 2003. Detail | |
| HRUŠKA, P., HÁJEK, K. THE NOISE BACKGROUND SUPPRESSION OF NOISE MEASURING SET- UPS. In Advanced experimental methods for noise research in nanoscale electronic devices. Dordrecht: Kluewer Academic Press, 2003. Detail | |
| GRMELA, L., HRUŠKA, P., KOKTAVÝ, P. Mechanika-kmity- vlny. Brno: 2003. Detail | |
| HRUŠKA, P., GRMELA, L., KOKTAVÝ, P. Elektřina, magnetizmus a termodynamika. ES. Brno: 2003. Detail | |
| HRUŠKA, P., HÁJEK, K. THE NOISE BACKGROUND SUPPRESSION OF NOISE MEASURING SET- UPS. Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices. Brno: Brno University of Technology, 2003. Detail | |
| 2002 | |
| HRUŠKA, P. Optika - IFY. 2002. Detail | www | |
| HRUŠKA, P. Elektřina, magnetismus - IFY. 2002. Detail | www | |
| 2001 | |
| HRUŠKA, P. Noise reliability indicators for PN junction devices. In Nové trendy ve fyzice. Vysoké učení technické v Brně, Fakulta elektrotechniky a informatiky, Ústav fyziky, Brno: VUT Brno, 2001. Detail | |
| 2000 | |
| HRUŠKA, P., KOLÁŘOVÁ, R., ŠIKULA, J. Burst noise with normal distribution of characteristic times in sub-micron ultra-thin-oxide MOSFET´ s. In Proceedings of 22nd International conference on microelectronics. Niš: IEEE, 2000. Detail | |
| 1998 | |
| HRUŠKA, P., KOLÁŘOVÁ, R. Spolehlivost zařízení s PN přechodem a indikátory spolehlivosti. In Electronic devices and systems (EDS´98). Brno: Technical University of Brno, Detail | |
| HRUŠKA, P. Polarization and fluctuation characteristics of tantalum solid electrolyte capacitors. Quality and Reliability Engineering International, 1998, roč. 1998, č. Mar- Apr, Detail | www | |
| 1997 | |
| HRUŠKA, P. Statistika vyšších řádů teplotního šumu ultramalých MOSFET. In Noise in physical systems and 1/ f fluctuation. Leuven: IMEC Leuven, Detail | |
| HRUŠKA, P. Intenzita přechodů a sspektrální šum v submikronových MOSFET. In Noise in physical systems and 1/ f fluctuations. Leuvene: IMEC Leuven, Detail | |
| HRUŠKA, P. Technologie rezistorů z tenkých vrstev a indikátory šumové spolehlivosti. In 21th Conference on Microelectronics MIEL 97. Nish: University Nish, Detail | |
| ŠIKULA, J., HRUŠKA, P., VAŠINA, P. Spektrální hustota šumu a spolehlivost tantalových kapacitorů. Capacitor and resistor technology, roč. 17, č. 1, Detail | |
| ŠIKULA, J., KOKTAVÝ, B., HRUŠKA, P., VAŠINA, P., KOKTAVÝ, P., HÁJEK, K. Noise Spectral Density and Reliability of Tantalum Capacitors. In 17th Capacitor and Resistor Technology Symposium CARTS’ 97. Florida, USA: 1997. Detail | |
| HRUŠKA, P. Thin film resitor technology and noise reliability indicators. In Proceedings of 21th Intern.conference on microelectronics, vol. 2. Niš: IEEE, 1997. Detail | |
| 1995 | |
| HRUŠKA, P., ŠIKULA, J., CHOBOLA, Z., JURÁNKOVÁ, V., PAZDERA, L. Analýza vlastností solárních panelů. In NODITO - Noise and Reliability of Semiconductor Devices. Brno: VUT Brno, Detail | |
| HRUŠKA, P., CHOBOLA, Z., ŠIKULA, J. Transport Reliability Indicators for Solar Cells. In Proceedings of Second ELEN conference. France: University of Technology, 1995. Detail | |
| CHOBOLA, Z., HRUŠKA, P., PAZDERA, L., JURÁNKOVÁ, V., ŠIKULA, J. Noise Reliability Indicators for Solar Cells. In Procedings of Second ELEN conerence. Grenoble: University of Technology, 1995. Detail | |
| HRUŠKA, P., CHOBOLA, Z., PAZDERA, L., JURÁNKOVÁ, V., ŠIKULA, J. Analysis of Solar Cell Transport Properties. In Proceeding of the International NODITO Workshop. Brno: University of Technology, 1995. Detail | |
| 1994 | |
| GRMELA, L., VAŠINA, P. Testovací zařízení pro spolehlivost LED. In Fluctuation phenomena in physical systems. Vilnius: Vilnius University Press, 1994. Detail | |
| HRUŠKA, P., KOKTAVÝ, B., VAŠINA, P., NAVAROVÁ, H., JURÁNKOVÁ, J., ŠIKULA, J. Transport and noise quality indicators for PN junction diodes. In 5th European Symposium on Reliability of Electron Devives, Failure Physics and Analysis. Glasgow, Scotland: QaRel, 1994. Detail | |
| HRUŠKA, P., KOKTAVÝ, B., VAŠINA, P. Přenos a indikátoru šumové spollehlivosti pro diody s PN přechodem. In Reliability in Electron Devices. 5. Glasgow: QaRel Associates, Detail | |
| HRUŠKA, P. Analýza teplotních změn I- U závislosti LED. In Electronic devices and systems. 2. Brno: Technical University of Brno, 1994. Detail | |
| 1993 | |
| ŠTRUNC, M., HRUŠKA, P. Fyzikální hlediska při výkladu interakce vln v elektronkách s postupnou a se zpětnou vlnou. In Radioelektronika´ 93. Brno: VUT v Brně, Detail | |
| HRUŠKA, P., ŠTRUNC, M. Elektronky TWT a jejich použití v radarové a telekomunikační technice. In Telekomunikace´ 93. Brno: VUT v Brně, Detail | |
Pokud je v údajích nesrovnalost, podívejte se do častých otázek k vizitkám.













