Course detail

Make students acquainted with electronic systems diagnostics methods.

To understand the principles of physical and functional diagnostics methods. To get practical knowledge of functional diagnostics methods.

The subject knowledge on the secondary school level is required.

Diagnostics and testing of electronic circuits. Failures classification and failure mechanisms. Physical and functional methods of technical diagnostics. Diagnostics system. The types of failures. Failures detection and localization. Diagnostics of logic and analogue circuits. Structural tests generation. Test equipments. Boundary scan, ASA testers, signature analyzers, logic analyzers. Design for testability and diagnostics. Diagnostics of microprocessors and microcomputers.

Teaching methods depend on the type of course unit as specified in the article 7 of BUT Rules for Studies and Examinations.

individual diagnostic task ....... 39 points
final test ............................. 61 points

Fundamental terminology of the diagnostic, diagnostic methods, diagnostic system and resources, diagnostic subject and task, category of the diagnostic subjects, online and offline diagnostics.
Types of failures, failures mechanisms. Failures of passive and active elements of electronic circuits. Failures of integrated circuits. CMOS circuits failures. Failures of the cables and interconnections and their reason.
Measurement as diagnostic an instrument of the electronic circuits, Consecution during diagnostic procedure of the electronic system. Diagnostic and testing during fabrication.
Diagnostic and testing of digital systems, Failures in logic circuits, Failure diagnostic in digital systems, failure modelling, logic gates testing, Boolean difference, test patterns for logic gates testing.
Build in Self Test systems, application for analog and mixed mode systems.
Boundary scan, JTAG and similar testing and debugging interfaces (OBD II, Debug Wire).
Design for testability - filters, analog to digital converters, delta-sigma modulators, PLLs, CRC.
Failure localization in electronic circuitry, modern approaches to failure localization, neural-network based approaches for analog circuit fault diagnostic

Loveday,G.C.: Electronic testing and fault diagnosis, Longman, 1995
Lenk,J.D.: McGraw-Hill electronic troubleshooting handbook, McGraw-Hill, 1995
Pain,R.: Practical electronic fault finding and troubleshooting, Newnes, 1995
Bushnell M.L., Agrawal V. D.: Essentials of Electronic Testing, Kluwer Academic Publishers, Boston, 2000
Hurst L.S.: VLSI testing, The Institution of EE, London, 1998
Miczo A.: Digital Logic Testing and Simulation, Wiley-Interscience, Hoboken,N.J., 2003
Mourad S.: Principles of Testing Electronic Systems, John Wiley & Sons Inc., New York, 2000
Segura J., Hawkins Ch.F.: CMOS Electronics How It Works, How It Fails, IEEE Inc., 2004
Burns M., Roberts G.W.: An Introduction to Mixed-Signal IC test and Measurement, Oxford University Press, 2001
Kuo J.B., Lou J.: Low-Voltage CMOS VLSI Circuits, John Wiley & Sons, 1999
Uyemura J.P.: Introduction to VLSI Circuits and Systems, John Wiley & Sons, 2002
Kwok K.N.: Complete Guide To Semiconductor Devices, Mc Graw-Hill Inc., 1995
MUSIL, V.,RECMAN, M., PROKOP, R. Diagnostika a testování elektronických systémů_S. ISBN MEL105. (skripta)
MUSIL, V., RECMAN, M., PROKOP, R. Diagnostika a testování elektronickýých systémů_P. ISBN MEL107. (skripta)
MUSIL, V., RECMAN, M., PROKOP, R. Diagnostika a testování elektronických systémů_L. ISBN MEL106. (skripta)